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suopublications He [6 articles]

Recent papers posted to suopublications library by the author He. You can also see everyones He.
  • Saturated voids in interconnect lines due to thermal strains and electromigration
    Journal of Applied Physics, Vol. 98, No. 7. (2005)
    by Zhen Zhang, Zhigang Suo, Jun He
    posted to electromigration by suopublications on 2006-07-18 22:34:01 as **
  • Statistics of Electromigration Lifetime Analyzed Using a Deterministic Transient Model
    STRESS-INDUCED PHENOMENA IN METALLIZATION: Seventh International Workshop on Stress-Induced Phenomena in Metallization, Vol. 741, No. 1. (2004), pp. 15-26.
    by Jun He, Z Suo
    edited by Paul S Ho, Shefford P Baker, Tomoji Nakamura, Cynthia A Volkert
    posted to electromigration by suopublications on 2006-07-18 22:29:08 as **
  • Experimental Determination of Crack Driving Forces in Integrated Structures
    STRESS-INDUCED PHENOMENA IN METALLIZATION: Seventh International Workshop on Stress-Induced Phenomena in Metallization, Vol. 741, No. 1. (2004), pp. 3-14.
    by Jun He, Guanghai Xu, Z Suo
    edited by Paul S Ho, Shefford P Baker, Tomoji Nakamura, Cynthia A Volkert
    posted to crack by suopublications on 2006-07-18 22:28:40 as **
  • Electromigration lifetime and critical void volume
    Applied Physics Letters, Vol. 85, No. 20. (2004), pp. 4639-4641.
    by Jun He, Z Suo, TN Marieb, JA Maiz
    posted to electromigration by suopublications on 2006-07-18 22:26:25 as **
  • Notch-sensitivity and shear bands in brittle matrix composites
    Acta Metallurgica et Materialia, Vol. 42, No. 9. (September 1994), pp. 3065-3070.
    by He, B Wu, Z Suo
    posted to composite notch by suopublications on 2006-07-18 21:14:47 as **
  • Initiation and arrest of an interfacial crack in a four-point bend test
    Engineering Fracture Mechanics, Vol. 72, No. 17. (November 2005), pp. 2584-2601.
    by Zhenyu Huang, Z Suo, Guanghai Xu, Jun He, JH Prevost, N Sukumar
    posted to crack interface by suopublications on 2006-07-18 14:19:03 as **
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