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suos Pfeifer [1 article]

Recent papers posted to suos library by the author Pfeifer. You can also see everyones Pfeifer.
  • Effect of barrier thickness on electromigration reliability of Cu/porous low k interconnects
    Applied Physics Letters, Vol. 87, No. 6. (2005)
    by Jung W Pyun, Xia Lu, Jayhoon Chung, Sean Yoon, Paul S Ho, Neil Henis, Kyle Neuman, Larry Smith, Klaus Pfeifer
    posted to electromigartion lowk by suo on 2006-08-24 13:57:46 as ***** along with 1 group suogroup
    • Bemerkung: Sie können diese Seite wie folgt zitieren: http://www.citeulike.org/user/suo/author/Pfeifer

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