Steady-state cracking in brittle substrates beneath adherent films

@article{citeulike:766814, abstract = {A crack in a brittle substrate parallel to the film/substrate interface is considered. Stress intensity factors are obtained as a function of fiim, substrate thickness, elastic properties and edge loads at arbitrary crack depth. These results, combined with the criterion K11 = 0. are used to predict the steady-state cracking depth. The critical combination of residual stress and film thickness below which steady-state substrate cracking is avoided can be inferred provided the substrate toughness is known.}, author = {Suo, Zhigang and Hutchinson, John W. }, citeulike-article-id = {766814}, doi = {http://dx.doi.org/10.1016/0020-7683(89)90096-6}, journal = {International Journal of Solids and Structures}, keywords = {crack}, number = {11}, pages = {1337--1353}, posted-at = {2006-07-20 18:06:37}, priority = {2}, title = {Steady-state cracking in brittle substrates beneath adherent films}, url = {http://dx.doi.org/10.1016/0020-7683(89)90096-6}, volume = {25}, year = {1989} }

TY - JOUR ID - citeulike:766814 L3 - citeulike-article-id:766814 N2 - A crack in a brittle substrate parallel to the film/substrate interface is considered. Stress intensity factors are obtained as a function of fiim, substrate thickness, elastic properties and edge loads at arbitrary crack depth. These results, combined with the criterion K11 = 0. are used to predict the steady-state cracking depth. The critical combination of residual stress and film thickness below which steady-state substrate cracking is avoided can be inferred provided the substrate toughness is known. IS - 11 JF - International Journal of Solids and Structures EP - 1353 TI - Steady-state cracking in brittle substrates beneath adherent films VL - 25 SP - 1337 KW - crack AU - Suo, Zhigang AU - Hutchinson, John PY - 1989/// UR - http://dx.doi.org/10.1016/0020-7683(89)90096-6 ER -