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Technometrics

Articles from the last few issues of Technometrics © American Statistical Association
  • The Future of Industrial Statistics: A Panel Discussion
    Technometrics, Vol. 50, No. 2. (May 2008), pp. 103-127.
    by Steinberg, M David, Bisgaard, Soren, Doganaksoy, Necip, Fisher, Nicholas, Gunter, Bert, Hahn, Gerald, Keller-Mcnulty, Sallie, Kettenring, Jon, Meeker, Q William, Montgomery, C Douglas, Wu, CF Jeff
  • Analysis of Window-Observation Recurrence Data
    Technometrics, Vol. 50, No. 2. (May 2008), pp. 128-143.
    by Zuo, Jianying, Meeker, Q William, Wu, Huaiqing
  • Bayesian Inference and Life Testing Plan for the Weibull Distribution in Presence of Progressive Censoring
    Technometrics, Vol. 50, No. 2. (May 2008), pp. 144-154.
    by Kundu, Debasis
  • Multivariate Exponentially Weighted Moving Covariance Matrix
    Technometrics, Vol. 50, No. 2. (May 2008), pp. 155-166.
    by Hawkins, M Douglas, Maboudou-Tchao, M Edgard
  • Estimation of Process Parameters to Determine the Optimum Diagnosis Interval for Control of Defective Items
    Technometrics, Vol. 50, No. 2. (May 2008), pp. 167-181.
    by Dasgupta, Tirthankar, Mandal, Abhyuday
  • Bayesian Inference for Multivariate Ordinal Data Using Parameter Expansion
    Technometrics, Vol. 50, No. 2. (May 2008), pp. 182-191.
    by Lawrence, Earl, Bingham, Derek, Liu, Chuanhai, Nair, N Vijayan
  • Bayesian Hierarchical Modeling for Integrating Low-Accuracy and High-Accuracy Experiments
    Technometrics, Vol. 50, No. 2. (May 2008), pp. 192-204.
    by Qian, ZG Peter, Wu, CF Jeff
  • Using Orthogonal Arrays in the Sensitivity Analysis of Computer Models
    Technometrics, Vol. 50, No. 2. (May 2008), pp. 205-215.
    by Morris, D Max, Moore, M Leslie, Mckay, D Michael
  • Loss Function Approaches to Predict a Spatial Quantile and Its Exceedance Region
    Technometrics, Vol. 50, No. 2. (May 2008), pp. 216-227.
    by Zhang, Jian, Craigmile, F Peter, Cressie, Noel
  • A Note on Computing the Probability and Critical Values for the Half-Normal Plot
    Technometrics, Vol. 50, No. 2. (May 2008), pp. 228-229.
    by Guirguis, H Georges
  • Response to Easterling's Review of Modern Experimental Design
    Technometrics, Vol. 50, No. 2. (May 2008), pp. 231-231.
    by Ryan, P Thomas
  • Practical PID Control, by Antonio Visioli
    Technometrics, Vol. 50, No. 2. (May 2008), pp. 232-233.
    by Neubauer, V Dean
  • Uncertainty Modeling and Analysis in Engineering and the Sciences, by Bilal M. Ayyub and George J. Klir
    Technometrics, Vol. 50, No. 2. (May 2008), pp. 233-234.
    by Sandry, D Thomas
  • Probability Theory in Finance: A Mathematical Guide to the BlackScholes Formula, by Sean Dineen
    Technometrics, Vol. 50, No. 2. (May 2008), pp. 234-235.
    by Caby, Errol
  • Principles of Statistical Inference, by D. R. Cox
    Technometrics, Vol. 50, No. 2. (May 2008), pp. 235-236.
    by Doksum, A Kjell
  • Beyond Beta: Other Continuous Families of Distributions With Bounded Support and Applications, by S. Kotz and J. R. van Dorp
    Technometrics, Vol. 50, No. 2. (May 2008), pp. 236-236.
    by Olive, J David
  • An Introduction to Stein's Method, edited by A. D. Barbour and L. H. Y. Chen
    Technometrics, Vol. 50, No. 2. (May 2008), pp. 236-236.
    by Chernick, R Michael
  • Excel for Scientists and Engineers: Numerical Methods, by E. Joseph Billo
    Technometrics, Vol. 50, No. 2. (May 2008), pp. 236-237.
    by Larsen, Greg
  • Margins of Error: A Study of Reliability in Survey Measurements, by Duane F. Alwin
    Technometrics, Vol. 50, No. 2. (May 2008), pp. 237-237.
    by Barker, Lawrence
  • Nonparametric Statistics With Applications to Science and Engineering, by Paul H. Kvam and Brani Vidakovic
    Technometrics, Vol. 50, No. 2. (May 2008), pp. 237-237.
    by Lu, ZQ John
  • Life Distributions: Structure on Nonparametric, Semiparametric and Parametric Families, by Albert W. Marshall and Ingram Olkin
    Technometrics, Vol. 50, No. 2. (May 2008), pp. 237-238.
    by Ahmed,
  • Reliable Reasoning: Induction and Statistical Learning Theory, by Gilbert Harman and Sanjeev Kulkarni
    Technometrics, Vol. 50, No. 2. (May 2008), pp. 238-238.
    by Ahmed,
  • Matrix Algebra: Theory, Computations, and Applications in Statistics, by James E. Gentle
    Technometrics, Vol. 50, No. 2. (May 2008), pp. 238-239.
    by Ahmed,
  • Technometrics at Fifty
    Technometrics, Vol. 50, No. 1. (February 2008), pp. 1-1.
    by Steinberg, M David
  • Technometrics: How It All Started
    Technometrics, Vol. 50, No. 1. (February 2008), pp. 2-7.
    by Steinberg, M David, Bisgaard, Soren
  • Evaluating Experiments for Estimating the Bit Failure Cross-Section of Semiconductors Using a Colored Spectrum Neutron Beam
    Technometrics, Vol. 50, No. 1. (February 2008), pp. 8-14.
    by Hengartner, W Nicolas, Michalak, E Sarah, Takala, E Bruce, Wender, A Stephen
  • A Critical Assessment of Two-Stage Group Screening Through Industrial Experimentation
    Technometrics, Vol. 50, No. 1. (February 2008), pp. 15-25.
    by Vine, , Lewis, , Dean, , Brunson,
  • New E(S2)-Optimal Supersaturated Designs Constructed From Incomplete Block Designs
    Technometrics, Vol. 50, No. 1. (February 2008), pp. 26-31.
    by Nguyen, Nam-Ky, Cheng, Ching-Shui
  • The False Discovery Rate for Multiple Testing in Factorial Experiments
    Technometrics, Vol. 50, No. 1. (February 2008), pp. 32-39.
    by Kimel, Maria Tripolski, Benjamini, Yoav, Steinberg, M David
  • Sequential Change-Point Detection Methods for Nonstationary Time Series
    Technometrics, Vol. 50, No. 1. (February 2008), pp. 40-52.
    by Choi, Hyunyoung, Ombao, Hernando, Ray, Bonnie
  • Cramervon Mises Tests for the Compatibility of Two Software Operating Environments
    Technometrics, Vol. 50, No. 1. (February 2008), pp. 53-63.
    by Jeske, , Lockhart, , Stephens, , Zhang,
  • Avoiding Problems With Normal Approximation Confidence Intervals for Probabilities
    Technometrics, Vol. 50, No. 1. (February 2008), pp. 64-68.
    by Hong, Yili, Meeker, Q William, Escobar, A Luis
  • Normal-Based Methods for a Gamma Distribution: Prediction and Tolerance Intervals and Stress-Strength Reliability
    Technometrics, Vol. 50, No. 1. (February 2008), pp. 69-78.
    by Krishnamoorthy, , Mathew, Thomas, Mukherjee, Shubhabrata
  • On the Reliability of the Self-Dual k-Out-of-n Systems
    Technometrics, Vol. 50, No. 1. (February 2008), pp. 79-85.
    by Carreras, Francesc, Freixas, Josep, Puente, Maria Albina
  • Letter to the Editor
    Technometrics, Vol. 50, No. 1. (February 2008), pp. 86-86.
    by De Castro, Mario, Galea-Rojas, Manuel, Bolfarine, Heleno
  • Statistical Monitoring of Clinical Trials, by Lemuel A. Moye
    Technometrics, Vol. 50, No. 1. (February 2008), pp. 87-88.
    by Hussein, Abdulkadir
  • Reliability and Risk: A Bayesian Perspective, by Nozer D. Singpurwalla
    Technometrics, Vol. 50, No. 1. (February 2008), pp. 88-88.
    by Ghosh, Subir
  • Multidimensional Nonlinear Descriptive Analysis (MUNDA), by Shizuhiko Nishisato
    Technometrics, Vol. 50, No. 1. (February 2008), pp. 88-89.
    by Burr, Thomas
  • Introductory Statistical Inference, by Nitis Mukhopadhyay
    Technometrics, Vol. 50, No. 1. (February 2008), pp. 89-90.
    by Katsaounis,
  • Statistical Design of Experiments With Engineering Applications, by Kamel Rekab and Muzaffar Shaikh
    Technometrics, Vol. 50, No. 1. (February 2008), pp. 90-91.
    by Neubauer, V Dean
  • Probability, Statistics, and Reliability for Engineers and Scientists (2nd ed.), by Bilal M. Ayyub and Richard H. McCuen
    Technometrics, Vol. 50, No. 1. (February 2008), pp. 91-91.
    by Ke, Weiming
  • Learning SAS by Example: A Programmer's Guide, by Ron Cody
    Technometrics, Vol. 50, No. 1. (February 2008), pp. 91-92.
    by Holt, Melinda
  • Data Preparation for Analytics Using SAS, edited by Gerhard Svolba
    Technometrics, Vol. 50, No. 1. (February 2008), pp. 92-92.
    by Nash, S Maliha
  • The Cross-Entropy Method, by Reuven Y. Rubinstein and Dirk P. Kroese
    Technometrics, Vol. 50, No. 1. (February 2008), pp. 92-92.
    by Booth, E David
  • Process Control Performance Assessment: From Theoryto Implementation, edited by Andrzej W. Ordys, Damien Uduehi, and Michael Johnson
    Technometrics, Vol. 50, No. 1. (February 2008), pp. 92-93.
    by Barrett,
  • Linear and Generalized Linear Mixed Models and Their Applications, by Jiming Jiang
    Technometrics, Vol. 50, No. 1. (February 2008), pp. 93-94.
    by Myers, E Donald
  • The Statistics of Gene Mapping, by David Siegmund and Benjamin Yakir
    Technometrics, Vol. 50, No. 1. (February 2008), pp. 94-94.
    by Qu, Xianggui
  • Life Cycle Reliability Engineering, by Guangbin Yang
    Technometrics, Vol. 50, No. 1. (February 2008), pp. 94-95.
    by Ng, HK Tony
  • Chemical Process Performance Evaluation, by Ali Cinar, Ahmet Palazoglu, and Ferhan Kayihan
    Technometrics, Vol. 50, No. 1. (February 2008), pp. 95-96.
    by Neubauer, V Dean
  • Pharmaceutical Statistics Using SAS A Practical Guide, edited by Alex Dmitrienko, Christy Chuang-Stein and Ralph D'Agostino Sr.
    Technometrics, Vol. 50, No. 1. (February 2008), pp. 96-96.
    by Chernick, R Michael
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